New images rooting from China claim to be “mold engineering drawings” that point to the next iPhone version having a larger edge-to-edge screen. Images like these are often used to create cases and accessories for new Apple products before they are announced or go on sale. Design mock ups are usually then created and tested so new products can then be ready to go on sale as soon as Apple releases a new device. If the images are proven to be genuine then the iPhone 5 may not see a dramatic change in case design. Last month a purported iPhone 5 front bezel showing a larger edge-to-edge screen was discovered. The proportions of this component do not appear to be the same as the renderings discovered today, however. Previous rumors also point to the iPhone 5 receiving a larger screen and the latest renderings do seem to support this rumor, as well. Apple has made design changes at the last minute on more than one occasion, however. One image also seems to suggest that a white iPhone 5 is also in the works. Hopefully it won’t have the same production delays that plagued the previous white version of the iPhone 4. If the white iPad 2 is any indication however, then the issues associated with manufacturing a white front seems to have been dealt with. Although Apple has increased the resolution of the iPhone screen over the past few years, they have not increased the size of the screen beyond 3.5 inches. Rival smartphones already include larger 4+ inch screens and Apple may find that they have no choice but to follow suit to compete. We would love to see the next iPhone come with a larger screen. Hopefully Apple will find a way to include the feature without dramatically increasing the size of the device. As it is now, our iPhone 4 already takes up enough room in our pocket. What do you think of the drawings and the possibility of the edge-to-edge screen? Let us know in the comments below! As usual, stay tuned for more tech news and info by following us on Twitter and/or subscribing to our RSS feed. [Source: AppleInsider] Authors:

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